Impact of hydrogen contamination on the total dose response of linear bipolar microcircuits

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn , Issue , 2007, Pages

  Adell, P C ^a   McClure, S ^a   Pease, R L ^b   Rax, B G ^a   Dunham, G W ^c   Barnaby, H J ^d   Chen, X J ^d  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b RLP Research   (United States)

^c NAVAL SURFACE WARFARE CENTER   (United States)

^d ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Enhanced low dose rate sensitivity; Hydrogen; Linear regulator; Passivation; Radiation effects; Temperature transducer; Total ionizing dose

Indexed keywords

ANALOG DEVICES; BIPOLAR LINEAR CIRCUITS; CAUSAL RELATIONSHIPS; ENHANCED LOW-DOSE RATE SENSITIVITY; HYDROGEN CONTENTS; INTERSIL; LINEAR BIPOLAR; LINEAR REGULATOR; LINEAR VOLTAGE REGULATORS; METALLIZATIONS; SILICON NITRIDE PASSIVATION; TEMPERATURE TRANSDUCER; TEMPERATURE TRANSDUCERS; TOTAL DOSE RESPONSE; TOTAL IONIZING DOSE;

BIPOLAR INTEGRATED CIRCUITS; ELECTRIC POTENTIAL; ELECTRON TRAPS; HYDROGEN; IONIZING RADIATION; PASSIVATION; PIEZOELECTRIC TRANSDUCERS; SILICON NITRIDE; VOLTAGE REGULATORS;

RADIATION EFFECTS;

EID: 70449565325     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RADECS.2007.5205490     Document Type: Conference Paper

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