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R. L. Pease, W. Will, and G. Perry, Dependence of Total Dose Response of Bipolar Linear Microcircuits on Applied Dose Rate, IEEE Trans. Nucl. Sei. , NS-41. 2544
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J. T. Beaucour, T. Carrière, A. Gach, D. Laxague and P. Poirot, Total Dose Effects on Negative Voltage Regulator, IEEE Trans. Nucl. Sei. , NS-41. 2420,1994.
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T. Carrière, A. Gach, D. Laxague and P. Poirot, Total Dose Effects on Negative Voltage Regulator, IEEE Trans. Nucl. Sei.
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A. H. Johnston, B. G. Rax, and C. I. Lee, Enhanced Damage in Linear Bipolar Integrated Circuits at Low Dose Rates, IEEE Trans. Nucl. Sei. , NS-41. 1650, 1995.
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B. G. Rax, and C. I. Lee, Enhanced Damage in Linear Bipolar Integrated Circuits at Low Dose Rates, IEEE Trans. Nucl. Sei. , NS-41. 1650
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T. Carrière, J. Beaucour, A. Gach, B. Johlander, and L. Adams, Dose Rate and Annealing Effects on Total Dose Response of MOS and Bipolar Circuits, IEEE Trans. Nucl. Sei. , NS2. 1567,1995.
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J. Beaucour, A. Gach, B. Johlander, and L. Adams, Dose Rate and Annealing Effects on Total Dose Response of MOS and Bipolar Circuits, IEEE Trans. Nucl. Sei. , NS2.
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D. M. Fleetwood, S. L. Rosier, R. N. Nowlin, R. D. Schrimpf, R. A. Reber, Jr. , M. DeLaus, P. S. Winokur, A. Wei, W. E. Combs, and R. L. Pease, Physical Mechanisms Contributing to Enhanced Bipolar Gain Degradation at Low Dose Rates, IEEE Trans. Nucl. Sei. . NS-41. 1871, 1994.
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S. L. Rosier, R. N. Nowlin, R. D. Schrimpf, R. A. Reber, Jr. , M. DeLaus, P. S. Winokur, A. Wei, W. E. Combs, and R. L. Pease, Physical Mechanisms Contributing to Enhanced Bipolar Gain Degradation at Low Dose Rates, IEEE Trans. Nucl. Sei. . NS-41. 1871
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R. D. Schrimpf, R. J. Graves, D. M. Schmidt, D. M. Fleetwood, R. L. Pease, W. E. Combs, and M. DeLaus, HardnessAssurance Issues for Lateral PNP Bipolar Junction Transistors, IEEE Trans. Nucl. Sei. , NS-42. 1641, 1995.
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R. J. Graves, D. M. Schmidt, D. M. Fleetwood, R. L. Pease, W. E. Combs, and M. DeLaus, HardnessAssurance Issues for Lateral PNP Bipolar Junction Transistors, IEEE Trans. Nucl. Sei. , NS-42. 1641
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Schrimpf, R.D.1
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8
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33747285957
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S. C. Witczak, R. D. Schrimpf, K. F. Galloway, D. M. Fleetwood, R. L. Pease, D. M. Schmidt, W. E. Combs, and J. S. Suehle, Accelerated Tests for Bounding the Low Dose Rate Radiation Response of Lateral PNP Bipolar Junction Transistors, this conference.
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R. D. Schrimpf, K. F. Galloway, D. M. Fleetwood, R. L. Pease, D. M. Schmidt, W. E. Combs, and J. S. Suehle, Accelerated Tests for Bounding the Low Dose Rate Radiation Response of Lateral PNP Bipolar Junction Transistors, This Conference.
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Witczak, S.C.1
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10
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P. L. Cole, D. Emily, W. E. Combs, M. A. Gehlhausen, and R. L. Pease, Post-Irradiation Degradation of Input bias Current on Commercial Linear Bipolar Integrated Circuits, this conference.
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D. Emily, W. E. Combs, M. A. Gehlhausen, and R. L. Pease, Post-Irradiation Degradation of Input Bias Current on Commercial Linear Bipolar Integrated Circuits, This Conference.
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Cole, P.L.1
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