Semiconductor devices for RF applications: Evolution and current status

Microelectronics Reliability

Volumn 41, Issue 2, 2001, Pages 145-168

  Schwierz, F ^a   Liou, J J ^b  

^a ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

^b University of Central Florida   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MICROELECTRONICS; RELIABILITY;

RADIO FREQUENCY TRANSISTORS;

HETEROJUNCTION BIPOLAR TRANSISTORS;

EID: 0035127976     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(00)00076-7     Document Type: Article

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