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Volumn 10, Issue 2, 1999, Pages 113-116

Silicon nanoelectronics for the 21st century

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; MOSFET DEVICES; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE STRUCTURES;

EID: 0032679692     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/10/2/301     Document Type: Article
Times cited : (31)

References (12)
  • 1
    • 0344870616 scopus 로고    scopus 로고
    • Semiconductor Industry Association webpage
    • The National Technology Roadmap for Semiconductors 1997 Semiconductor Industry Association webpage www.semichips.org
    • (1997)
  • 4
    • 0344438790 scopus 로고    scopus 로고
    • Fabrication of MOSFET device with extreme UV lithography
    • Nguyen K B et al 1996 Fabrication of MOSFET device with extreme UV lithography J. Vac. Sci. Tech. B 14 4188
    • (1996) J. Vac. Sci. Tech. B , vol.14 , pp. 4188
    • Nguyen, K.B.1
  • 5
    • 0027594079 scopus 로고
    • Future CMOS scaling and reliability
    • Hu C 1993 Future CMOS scaling and reliability Proc. IEEE pp 682-9
    • (1993) Proc. IEEE , pp. 682-689
    • Hu, C.1
  • 6
    • 84949585169 scopus 로고
    • Ultra-thin silicon dioxide leakage current and scaling limit
    • Schuegraf K et al 1992 Ultra-thin silicon dioxide leakage current and scaling limit Symp. VLSI Technology (Dig. Tech. Papers) pp 18-19
    • (1992) Symp. VLSI Technology (Dig. Tech. Papers) , pp. 18-19
    • Schuegraf, K.1
  • 7
    • 0030387118 scopus 로고    scopus 로고
    • Limits and projections of gate oxide scaling Int. Electronic Device Meeting Tech
    • Hu C 1996 Limits and projections of gate oxide scaling Int. Electronic Device Meeting Tech. Digest pp 319-22
    • (1996) Digest , pp. 319-322
    • Hu, C.1
  • 9
    • 0031630542 scopus 로고    scopus 로고
    • Channel size dependence of dopant-induced threshold voltage fluctuation
    • Takeuchi K 1998 Channel size dependence of dopant-induced threshold voltage fluctuation Symp. on VLSI Technology (Dig. Tech. Papers) pp 72-3
    • (1998) Symp. on VLSI Technology (Dig. Tech. Papers) , pp. 72-73
    • Takeuchi, K.1
  • 11


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.