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Volumn 35, Issue 19, 1999, Pages 1670-1671

0.1μm high performance metamorphic in0.32Al0.68As/In0.33Ga0.67as HEMT on GaAs using inverse step InAlAs buffer

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; CURRENT VOLTAGE CHARACTERISTICS; DISLOCATIONS (CRYSTALS); ELECTRON TRANSPORT PROPERTIES; MOLECULAR BEAM EPITAXY; RELAXATION PROCESSES; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR GROWTH; TRANSCONDUCTANCE;

EID: 0032645445     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19991030     Document Type: Article
Times cited : (6)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.