SCOPUS 정보 검색 플랫폼

Volumn 13, Issue 2, 2012, Pages 437-443

High-resolution scanning transmission electron microscopy (HRSTEM) techniques: High-resolution imaging and spectroscopy side by side

(5) Stroppa, Daniel G a,b Zagonel, Luiz F a Montoro, Luciano A a Leite, Edson R c Ramirez, Antonio J a,b

a BRAZILIAN CENTER FOR RESEARCH IN ENERGY AND MATERIALS CNPEM (Brazil)

b UNIVERSITY OF CAMPINAS (Brazil)

c FEDERAL UNIVERSITY OF SÃO CARLOS (Brazil)

Author keywords

atomic resolution imaging; high resolution scanning transmission electron microscopy; materials science; nanostructures

Indexed keywords

ATOMS; ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; ELECTRONS; ENERGY DISPERSIVE SPECTROSCOPY; ENERGY DISSIPATION; MATERIALS SCIENCE; NANOSTRUCTURES; SCANNING; SCANNING ELECTRON MICROSCOPY;

ATOMIC-RESOLUTION IMAGING; COMPREHENSIVE ASSESSMENT; HIGH RESOLUTION SCANNING TRANSMISSION ELECTRON MICROSCOPIES; HIGH-ANGLE ANNULAR DARK FIELDS; HIGH-RESOLUTION IMAGING; QUANTITATIVE CHARACTERIZATION; SYNERGISTIC COMBINATIONS; X-RAY ENERGY DISPERSIVE SPECTROSCOPY;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 84856396304 PISSN: 14394235 EISSN: 14397641 Source Type: Journal
DOI: 10.1002/cphc.201100729 Document Type: Review

Times cited : (14)

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