Erratum: Annular dark-field scanning transmission electron microscopy (ADF-STEM) tomography of polymer systems (Journal of Electron Microscopy 2010 59:S1 (S39-S44) DOI: 10.1093/jmicro/dfq048);Annular dark-field scanning transmission electron microscopy (ADF-STEM) tomography of polymer systems

Journal of Electron Microscopy

Volumn 59, Issue SUPPL. 1, 2010, Pages 531-

  Lu, Kangbo ^a,b   Sourty, Erwan ^c   Loos, Joachim ^b,d  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b DUTCH POLYMER INSTITUTE DPI   (Netherlands)

^c Unit 102   (China)

^d UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

ADF STEM; contrast; polymers; quantification; thick samples; tomography

Indexed keywords

FILLED POLYMERS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANOCOMPOSITES; SCANNING ELECTRON MICROSCOPY; TOMOGRAPHY;

ANNULAR DARK FIELD SCANNING TRANSMISSION ELECTRON MICROSCOPY; BRIGHT-FIELDS; CONTRAST; CONVENTIONAL TRANSMISSION ELECTRON MICROSCOPIES; FILLED-POLYMERS; POLYMER SYSTEMS; POLYMER-NANOCOMPOSITE; QUANTIFICATION; THICK SAMPLES; VOLUME CONCENTRATION;

CARBON BLACK;

EID: 77955529112     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfq077     Document Type: Erratum

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