Direct oxygen imaging within a ceramic interface, with some observations upon the dark contrast at the grain boundary

Ultramicroscopy

Volumn 111, Issue 4, 2011, Pages 285-289

  Findlay, S D ^a   Azuma, S ^a   Shibata, N ^a,b   Okunishi, E ^c   Ikuhara, Y ^a,d,e  

^a UNIVERSITY OF TOKYO   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c JEOL LTD   (Japan)

^d JAPAN FINE CERAMICS CENTER   (Japan)

^e TOHOKU UNIVERSITY   (Japan)

Author keywords

Annular bright field (ABF); High angle annular dark field (HAADF); Scanning transmission electron microscopy (STEM)

Indexed keywords

ATOMIC COLUMNS; BRIGHT FIELDS; BRIGHT-FIELD IMAGES; DARK FIELD IMAGES; FINITE SOURCES; HIGH-ANGLE ANNULAR DARK FIELD (HAADF); HIGH-ANGLE ANNULAR DARK FIELDS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM); SPECIMEN THICKNESS;

GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; OXYGEN; SCANNING;

TRANSMISSION ELECTRON MICROSCOPY;

ALUMINUM OXIDE; OXYGEN;

ARTICLE; BRIGHT FIELD MICROSCOPY; COMPUTER INTERFACE; CONTRAST ENHANCEMENT; CONTROLLED STUDY; FINITE ELEMENT ANALYSIS; HIGH ANGLE ANNULAR DARK FIELD SCANNING TRANSMISSION ELECTRON MICROSCOPY; IMAGE ANALYSIS; IMAGE PROCESSING; IMAGE QUALITY; IMAGE RECONSTRUCTION; INTERMETHOD COMPARISON; MOLECULAR IMAGING; OPTICAL RESOLUTION; PROCESS DESIGN; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

EID: 78651466800     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.12.022     Document Type: Article

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