Three-dimensional imaging in aberration-corrected electron microscopes

Microscopy and Microanalysis

Volumn 16, Issue 4, 2010, Pages 445-455

  Xin, Huolin L ^a   Muller, David A ^a  

^a Cornell University   (United States)

Author keywords

3D imaging; aberration corrected electron microscopy; ADF SCEM; ADF STEM; BF SCEM; depth sectioning

Indexed keywords

EID: 77957235525     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927610093360     Document Type: Conference Paper

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