Experimental examination of the characteristics of bright-field scanning confocal electron microscopy images

Journal of Electron Microscopy

Volumn 60, Issue 3, 2011, Pages 227-234

  Hashimoto, Ayako ^a   Mitsuishi, Kazutaka ^a,b   Shimojo, Masayuki ^a   Zhu, Yufang ^a   Takeguchi, Masaki ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b SAITAMA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

bright field imaging; confocal imaging; depth sectioning; scanning confocal electron microscopy; stage scanning system; three dimensional imaging

Indexed keywords

GOLD; METAL NANOPARTICLE;

ARTICLE; CHEMISTRY; CONFOCAL MICROSCOPY; METHODOLOGY; SCANNING ELECTRON MICROSCOPY; THREE DIMENSIONAL IMAGING; TRANSMISSION ELECTRON MICROSCOPY; ULTRASTRUCTURE;

GOLD; IMAGING, THREE-DIMENSIONAL; METAL NANOPARTICLES; MICROSCOPY, CONFOCAL; MICROSCOPY, ELECTRON, SCANNING; MICROSCOPY, ELECTRON, TRANSMISSION;

ELECTRONS; GOLD NANOPARTICLES; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IMAGE ENHANCEMENT; IMAGING SYSTEMS;

BRIGHT FIELD TRANSMISSION ELECTRON MICROSCOPY; BRIGHT-FIELD IMAGING; BRIGHT-FIELDS; CONFOCAL IMAGING; DEPTH SECTIONING; ELECTRON MICROSCOPY IMAGES; FIELD IMAGING; SCANNING CONFOCAL ELECTRON MICROSCOPY; STAGE-SCANNING SYSTEM; THREE DIMENSIONAL IMAGING;

SCANNING ELECTRON MICROSCOPY;

EID: 79958800842     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfr013     Document Type: Article

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