Chemical imaging at atomic resolution as a technique to refine the local structure of nanocrystals

Angewandte Chemie - International Edition

Volumn 50, Issue 4, 2011, Pages 868-872

  Trasobares, Susana ^a   Lõpez Haro, Miguel ^a   Kociak, Mathieu ^b   March, Katia ^b   De La Peña, Francisco ^b   Perez Omil, Jose A ^a   Calvino, Jose J ^a   Lugg, Nathan R ^c   D'Alfonso, Adrian J ^c   Allen, Leslie J ^c   Colliex, Christian ^b  

^a UNIVERSITY OF CÁDIZ   (Spain)

^b UNIVERSITÉ PARIS SUD   (France)

^c UNIVERSITY OF MELBOURNE   (Australia)

Author keywords

ceria zirconia; EELS; mixed oxides; nanocrystals; scanning probe microscopy

Indexed keywords

ABERRATION-CORRECTED ELECTRON MICROSCOPY; ATOMIC RESOLUTION; CERIA-ZIRCONIA; CHEMICAL COMPOSITIONS; CHEMICAL EVIDENCES; CHEMICAL IMAGING; EELS; LOCAL DEVIATION; LOCAL STRUCTURE; LOSS ELECTRONS; MIXED OXIDE; NANO-SIZED; SCANNING PROBES; SUB-LATTICES;

CERIUM; CERIUM ALLOYS; CERIUM COMPOUNDS; NANOCRYSTALS; PROBES; SCANNING PROBE MICROSCOPY; ZIRCONIA; ZIRCONIUM;

ELECTRON ENERGY LOSS SPECTROSCOPY;

CERIUM; NANOPARTICLE; OXYGEN; ZIRCONIUM;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; PARTICLE SIZE;

CERIUM; MICROSCOPY, ATOMIC FORCE; NANOPARTICLES; OXYGEN; PARTICLE SIZE; ZIRCONIUM;

EID: 78751541131     PISSN: 14337851     EISSN: 15213773     Source Type: Journal    
DOI: 10.1002/anie.201004502     Document Type: Article

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