Analysis of EEL spectrum of low-loss region using the Cs-corrected STEM-EELS method and multivariate analysis

Ultramicroscopy

Volumn 111, Issue 5, 2011, Pages 303-308

  Yamazaki, Takashi ^a   Kotaka, Yasutoshi ^a   Kataoka, Yuji ^a  

^a FUJITSU LABORATORIES LTD   (Japan)

Author keywords

CS corrected HAADF STEM; Interface plasmon state; Multivariate analysis

Indexed keywords

DIELECTRIC CHARACTERISTICS; DIELECTRIC FUNCTIONS; ELECTRON ENERGY LOSS SPECTRUM; HAADF-STEM; INTERFACE PLASMON STATE; INTERFACE STATE; LOW LOSS; LOW-LOSS SPECTRA; MULTIVARIATE ANALYSIS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SPHERICAL ABERRATIONS; STEM-EELS;

DIELECTRIC MATERIALS; DISSOCIATION; ENERGY DISSIPATION; MULTIVARIANT ANALYSIS; NUCLEAR INSTRUMENTATION; PLASMONS; SILICON COMPOUNDS; SPECTRUM ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON ENERGY LOSS SPECTROSCOPY;

SILICON; SILICON DIOXIDE;

ANALYTIC METHOD; ARTICLE; CHEMICAL ANALYSIS; CONTROLLED STUDY; DIELECTRIC CONSTANT; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY YIELD; MATHEMATICAL MODEL; MOLECULAR IMAGING; OPTICAL RESOLUTION; QUANTITATIVE STUDY; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SPECTRAL SENSITIVITY;

EID: 79551539354     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.01.005     Document Type: Article

References (29)

1. Couillard M., Yurtsever A., Muller D. Physical Review B 2008, 77:85318.
2. Yurtsever A., Couillard M., Muller D. Physical Review Letters 2008, 100:217402.
3. Miyajima T., Oogane M., Kotaka Y., Yamazaki T., Tsukada M., Kataoka Y., Naganuma H., Ando Y. Applied Physics Express 2009, 2:3001.
4. Pennycook S.J., Nellist P.D. Impact of Electron and Scanning Probe Microscopy on Materials Research 1999, Kluwer, Dordrecht.
5. D.B. William, C.B. Carter, Transmission Electron Microscopy-A Textbook for Materials Science, 1996.
6. Bosman M., Keast V.J., Garcia-Munoz J.L., D'alfonso A.J., Findlay S.D., Allen L.J. Physical Review Letters 2007, 99:86102.
7. Kimoto K., Asaka T., Nagai T., Saito M., Matsui Y., Ishizuka K. Nature 2007, 450:702.
8. Andrew J., Hancewicz T. Applied Spectroscopy 1998, 52:797.
9. De Juan A., Tauler R. Analytica Chimica Acta 2003, 500:195.
10. Wang J., Hopke P., Hancewicz T., Zhang S. Analytica Chimica Acta 2003, 476:93.
11. Yamamoto Y., Tatsumi K., Muto S. Materials Transactions-JIM 2007, 48:2590.
12. Gass M.H., Papworth A.J., Bullough T.J., Chalker P.R. Ultramicroscopy 2004, 101:257.
13. Schaffer B., Kothleitner G., Grogger W. Ultramicroscopy 2006, 106:1129.
14. Gu L., Sigle W., Koch C., Nelayah J., Srot V., van Aken P. Ultramicroscopy 2009, 109:1164.
15. Yamazaki T., Kotaka Y., Tsukada M., Kataoka Y. Ultramicroscopy 2010, 110:1161.
16. Egerton R.F. Electron Energy-loss Spectroscopy in the Electron Microscope 1996, Plenum Press, New York. second ed.
17. P. Blaha, K. Schwarz, G. Madsen, D. Kvasnicka, J. Luitz, Wien2k, an augmented plane wave+local orbitals program for calculating crystal properties, Karlheinz Schwarz, Techn. Universitat Wien, Austria, 2001.
18. Abt R., Ambrosch-Draxl C., Knoll P. Physica B 1994, 194:1451.
19. Ambrosch-Draxl C., Majewski J.A., Vogl P., Leising G. Physical Review B 1995, 51:9668.
20. Ambrosch-Draxl C., Sofo J. Computer Physics Communications 2006, 175:1.
21. Kohiki S., Arai M., Yoshikawa H., Fukushima S., Oku M., Waseda Y. Physical Review B 2000, 62:7964.
22. Arai M., Kohiki S., Yoshikawa H., Fukushima S., Waseda Y., M O. Physical Review B 2002, 65:85101.
23. Guo X.G., Chen X.S., Lu W. Solid State Communications 2003, 126:441.
24. Yamazaki T., Watanabe K., Nakanishi N., Hashimoto I. Ultramicroscopy 2004, 99:125.
25. Watanabe K., Kikuchi Y., Yamazaki T., Asano E., Nakanishi N., Kotaka Y., Okunishi E., Hashimoto I. Acta Crystallographica Section A: Foundations of Crystallography 2004, 60:591.
26. Wang Z.L. Elastic and Inelastic Scattering in Electron Diffraction and Imaging 1996, Plenum Press, New York.
27. Moreau P., Brun N., Walsh C.A., Coliex C., Howie A. Physical Review B 1997, 56:6774.
28. Kobayashi H., Yamashita Y., Mori T., Nakato Y., Komeda T., Nishioka Y. Japanese Journal of Applied Physics 1995, 34:959.
29. Couillard M., Kociak M., Stéphan O., Botton G.A., Colliex C. Physical Review B 2007, 76:165131.