Advance in orientation microscopy: Quantitative analysis of nanocrystalline structures

ACS Nano

Volumn 5, Issue 4, 2011, Pages 2580-2586

  Seyring, Martin ^a   Song, Xiaoyan ^b   Rettenmayr, Markus ^a  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

^b BEIJING UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

grain boundary analysis; nanobeam diffraction (NBD); nanocrystalline Cu; nanograin structure; orientation microscopy; transmission electron microscopy (TEM)

Indexed keywords

GRAIN BOUNDARY ANALYSIS; NANO GRAIN STRUCTURE; NANOBEAM DIFFRACTION (NBD); NANOCRYSTALLINE CU; ORIENTATION MICROSCOPY;

DIFFRACTION; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; MATERIALS PROPERTIES; NANOWIRES; TRANSMISSION ELECTRON MICROSCOPY;

NANOCRYSTALLINE MATERIALS;

EID: 79955412420     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn1023126     Document Type: Article

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