Quantitative, nanoscale mapping of sp2 percentage and crystal orientation in carbon multilayers

Carbon

Volumn 47, Issue 1, 2009, Pages 94-101

  Bosman, M ^a   Keast, V J ^b   Watanabe, M ^c   McCulloch, D G ^d   Shakerzadeh, M ^e   Teo, E H T ^e   Tay, B K ^e  

^a INSTITUTE OF MICROELECTRONICS   (Singapore)

^b UNIVERSITY OF NEWCASTLE   (Australia)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^d RMIT UNIVERSITY   (Australia)

^e NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; CHEMICAL BONDS; CONFORMAL MAPPING; CRYSTAL ORIENTATION; ELECTRON ENERGY LOSS SPECTROSCOPY; GRAPHITE; MULTIVARIANT ANALYSIS; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY;

ANALYTICAL TECHNIQUES; BONDING MAPS; CHEMICAL BONDINGS; ELECTRON ENERGIES; MULTIVARIATE STATISTICAL ANALYSIS; NANOSCALE MAPPINGS; PLASMON ENERGIES; ROBUST METHODS; SPATIAL ORIENTATIONS; SPATIAL RESOLUTIONS;

AMORPHOUS CARBON;

EID: 56949105921     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.carbon.2008.09.033     Document Type: Article

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