Decisive factors for realizing atomic-column resolution using STEM and EELS (DOI:10.1016/j.micron.2007.09.009);Decisive factors for realizing atomic-column resolution using STEM and EELS

Micron

Volumn 39, Issue 3, 2008, Pages 257-262

  Kimoto, Koji ^a   Ishizuka, Kazuo ^a,b   Matsui, Yoshio ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b Higashimatsuyama   (Japan)

Author keywords

Delocalization; Electron energy loss spectroscopy; Scanning transmission electron microscopy; Spatial resolution; Spectrum imaging

Indexed keywords

ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY DISSIPATION; INELASTIC SCATTERING; IONIZATION POTENTIAL; SILICON COMPOUNDS;

ATOMIC COLUMN RESOLUTION; DELOCALIZATION; SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM); SPATIAL RESOLUTION; SPECTRUM IMAGING;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 39549123394     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2007.09.011     Document Type: Erratum

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