Imaging properties of bright-field and annular-dark-field scanning confocal electron microscopy

Ultramicroscopy

Volumn 111, Issue 1, 2010, Pages 20-26

  Mitsuishi, K ^a   Hashimoto, A ^a   Takeguchi, M ^a   Shimojo, M ^b   Ishizuka, K ^c  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b SAITAMA INSTITUTE OF TECHNOLOGY   (Japan)

^c Higashimatsuyama   (Japan)

Author keywords

3D STEM; Confocal electron microscopy; Confocal STEM; Image simulation; Multislice method; Optical sectioning; SCEM

Indexed keywords

3D STEM; CONFOCAL ELECTRON MICROSCOPY; CONFOCAL STEM; IMAGE SIMULATIONS; MULTI SLICES; OPTICAL SECTIONING; SCEM;

ELECTRON MICROSCOPY; ELECTRONS;

THREE DIMENSIONAL;

ANNULAR DARK FIELD SCANNING CONFOCAL ELECTRON MICROSCOPY; ARTICLE; BRIGHT FIELD SCANNING CONFOCAL ELECTRON MICROSCOPY; CALCULATION; CONTRAST; CONTROLLED STUDY; GEOMETRY; IMAGE ANALYSIS; IMAGE QUALITY; INTERMETHOD COMPARISON; PARTICLE SIZE; SAMPLE SIZE; SCANNING ELECTRON MICROSCOPY; SIGNAL PROCESSING; SIMULATION; VALIDATION PROCESS;

EID: 78149274917     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.08.004     Document Type: Article

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