Calculations of electron inelastic mean free paths. IX. Data for 41 elemental solids over the 50 eV to 30 keV range

Surface and Interface Analysis

Volumn 43, Issue 3, 2011, Pages 689-713

  Tanuma, S ^a   Powell, C J ^b   Penn, D R ^b  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

AES; Elemental solids; Inelastic mean free paths; XPS

Indexed keywords

AES; BETHE EQUATION; ELECTRON ENERGIES; ELECTRON INELASTIC MEAN FREE PATHS; ELEMENTAL SOLIDS; INELASTIC MEAN FREE PATH; INELASTIC MEAN FREE PATHS; OPTICAL DATA; POLE APPROXIMATION; RMS DEVIATIONS; ROOT MEAN SQUARES; TPP-2M EQUATION; XPS;

APPROXIMATION ALGORITHMS; CESIUM; ELECTRONS; GADOLINIUM; GERMANIUM; GRAPHITE; HAFNIUM; IRIDIUM; OSMIUM; PLATINUM; RHODIUM; SCANDIUM; SODIUM; TIN; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 79951491454     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3522     Document Type: Article

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