Extending the analysis of EELS spectrum-imaging data, from elemental to bond mapping in complex nanostructures

Ultramicroscopy

Volumn 109, Issue 1, 2008, Pages 32-38

  Arenal, R ^a   de la Pena F ^b   Stephan O ^b   Walls, M ^b   Tence M ^b   Loiseau, A ^a   Colliex, C ^b  

^a Centre National de la Recherche Scientifique   (France)

^b UNIVERSITÉ PARIS SUD   (France)

Author keywords

Chemical bonding maps; EELS; MLS; Spectrum imaging

Indexed keywords

BORON; BORON NITRIDE; CHEMICAL BONDS; CONFORMAL MAPPING; CURVE FITTING; NITRIDES; SPECTRUM ANALYSIS;

BONDING TYPES; CHEMICAL BONDING MAPS; COMPLEX NANOSTRUCTURES; EELS; ELECTRON ENERGIES; FINE STRUCTURES; IMAGING DATUMS; IMAGING MODES; LEAST SQUARES FITTINGS; LONG TIMES; MLS; SPECTRUM-IMAGING;

ELECTRON ENERGY LOSS SPECTROSCOPY;

NANOMATERIAL;

ARTICLE; CHEMICAL BOND; ELECTRON BEAM; ELECTRON ENERGY LOSS SPECTROSCOPY; MAGNIFICATION RADIOGRAPHY; NANOANALYSIS;

EID: 55949086241     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.07.005     Document Type: Article

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