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Volumn 111, Issue 3, 2011, Pages 177-185

In situ analysis of gas composition by electron energy-loss spectroscopy for environmental transmission electron microscopy

Author keywords

Catalysts; EELS; Environmental; Gas; In situ; TEM

Indexed keywords

ACQUISITION TIME; EELS; ENVIRONMENTAL; ENVIRONMENTAL TRANSMISSION ELECTRON MICROSCOPES; ENVIRONMENTAL TRANSMISSION ELECTRON MICROSCOPY; GAS ANALYSIS; GAS COMPOSITIONS; GAS DIFFUSION; GAS PATH; IN-SITU; IN-SITU ANALYSIS; LOW LOSS; MASS TRANSPORT; QUANTITATIVE ANALYSIS; REACTION CELLS; REAL TIME ANALYSIS; TEM;

EID: 78650051816     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.11.005     Document Type: Article
Times cited : (78)

References (31)
  • 1
    • 40249116242 scopus 로고    scopus 로고
    • Ceria-catalyzed soot oxidation studied by environmental transmission electron microscopy
    • Simonsen S.B., Dahl S., Johnson E., Helveg S. Ceria-catalyzed soot oxidation studied by environmental transmission electron microscopy. Journal of Catalysis 2008, 255:1-5.
    • (2008) Journal of Catalysis , vol.255 , pp. 1-5
    • Simonsen, S.B.1    Dahl, S.2    Johnson, E.3    Helveg, S.4
  • 3
    • 33646031783 scopus 로고    scopus 로고
    • Environmental electron microscopy (ETEM) for catalysts with a closed E-cell with carbon windows
    • Giorgio S., Sao Joao S., Nitsche S., Chaudanson D., Sitja G., C.R.H. Environmental electron microscopy (ETEM) for catalysts with a closed E-cell with carbon windows. Ultramicroscopy 2006, 106:503-507.
    • (2006) Ultramicroscopy , vol.106 , pp. 503-507
    • Giorgio, S.1    Sao Joao, S.2    Nitsche, S.3    Chaudanson, D.4    Sitja, G.C.R.H.5
  • 4
    • 38049123440 scopus 로고    scopus 로고
    • Atomic-resolution environmental transmission electron microscopy for probing gas-solid reactions in heterogeneous catalysis
    • Gai P.L., Boyes E.D., Helveg S., Hansen P.L., Giorgio S., Henry C.R. Atomic-resolution environmental transmission electron microscopy for probing gas-solid reactions in heterogeneous catalysis. MRS Bulletin 2007, 32:1044-1050.
    • (2007) MRS Bulletin , vol.32 , pp. 1044-1050
    • Gai, P.L.1    Boyes, E.D.2    Helveg, S.3    Hansen, P.L.4    Giorgio, S.5    Henry, C.R.6
  • 5
    • 0033440357 scopus 로고    scopus 로고
    • Environmental high resolution electron microscopy of gas-catalyst reactions
    • Gai P.L. Environmental high resolution electron microscopy of gas-catalyst reactions. Topics in Catalysis 1999, 8:97-113.
    • (1999) Topics in Catalysis , vol.8 , pp. 97-113
    • Gai, P.L.1
  • 6
    • 84977556406 scopus 로고    scopus 로고
    • Oxidation and reduction of small palladium particles on silica
    • Crozier P.A., Sharma R., Datye A.K. Oxidation and reduction of small palladium particles on silica. Microscopy and Microanalysis 1998, 4:278-285.
    • (1998) Microscopy and Microanalysis , vol.4 , pp. 278-285
    • Crozier, P.A.1    Sharma, R.2    Datye, A.K.3
  • 8
    • 52949140563 scopus 로고    scopus 로고
    • In Situ environmental TEM studies of dynamic changes in cerium-based oxide nanoparticles during redox processes
    • Crozier P.A., Wang R., Sharma R. In Situ environmental TEM studies of dynamic changes in cerium-based oxide nanoparticles during redox processes. Ultramicroscopy 2008, 108:1432-1440.
    • (2008) Ultramicroscopy , vol.108 , pp. 1432-1440
    • Crozier, P.A.1    Wang, R.2    Sharma, R.3
  • 9
    • 80051809047 scopus 로고    scopus 로고
    • Atomic scale observation of the Ni activation process for partial oxidation of methane using in-situ environmental TEM, ChemCatChem, in press, doi:.
    • S. Chenna, R. Banerjee, P.A. Crozier, Atomic scale observation of the Ni activation process for partial oxidation of methane using in-situ environmental TEM, ChemCatChem, in press, doi:. http://10.1002/cctc.201000238.
    • Chenna, S.1    Banerjee, S.2    Crozier, P.A.3
  • 10
    • 65249099056 scopus 로고    scopus 로고
    • Structural transformation in ceria nanoparticles during redox processes
    • Wang R., Crozier P.A., Sharma R. Structural transformation in ceria nanoparticles during redox processes. Journal of Physical Chemistry C 2009, 113:5700-5704.
    • (2009) Journal of Physical Chemistry C , vol.113 , pp. 5700-5704
    • Wang, R.1    Crozier, P.A.2    Sharma, R.3
  • 11
    • 33749679964 scopus 로고    scopus 로고
    • Nanoscale heterogeneity in ceria zirconia with low-temperature redox properties
    • Wang R., Crozier P.A., Sharma R., Adams J.B. Nanoscale heterogeneity in ceria zirconia with low-temperature redox properties. Journal of Physical Chemistry B 2006, 110:18278-18285.
    • (2006) Journal of Physical Chemistry B , vol.110 , pp. 18278-18285
    • Wang, R.1    Crozier, P.A.2    Sharma, R.3    Adams, J.B.4
  • 12
    • 43149095823 scopus 로고    scopus 로고
    • Measuring the redox activity of individual catalytic nanoparticles in cerium-based oxides
    • Wang R., Crozier P.A., Sharma R., Adams J.B. Measuring the redox activity of individual catalytic nanoparticles in cerium-based oxides. Nanoletters 2008, 8:962-967.
    • (2008) Nanoletters , vol.8 , pp. 962-967
    • Wang, R.1    Crozier, P.A.2    Sharma, R.3    Adams, J.B.4
  • 13
    • 29044439865 scopus 로고    scopus 로고
    • Environmental Transmission Electron Microscopy in Nanotechnology
    • Kluwer Academic Publishers, New York, N. Yao, Z.L. Wang (Eds.)
    • Sharma R., Crozier P.A. Environmental Transmission Electron Microscopy in Nanotechnology. Handbook of Microscopy for Nanotechnology 2005, 531-563. Kluwer Academic Publishers, New York. N. Yao, Z.L. Wang (Eds.).
    • (2005) Handbook of Microscopy for Nanotechnology , pp. 531-563
    • Sharma, R.1    Crozier, P.A.2
  • 14
    • 0042922768 scopus 로고    scopus 로고
    • An environmental transmission electron microscope for in-situ observation of chemical processes at the nanometer level
    • Sharma R., Crozier P.A., Marx R., Weiss K. An environmental transmission electron microscope for in-situ observation of chemical processes at the nanometer level. Microscopy and Microanalysis. CD 2003, 9:912-913.
    • (2003) Microscopy and Microanalysis. CD , vol.9 , pp. 912-913
    • Sharma, R.1    Crozier, P.A.2    Marx, R.3    Weiss, K.4
  • 16
    • 27744528533 scopus 로고    scopus 로고
    • Phase transitions of single salt particles studied using a transmission electron microscope with an environmental cell
    • Wise M.E., Biskos G., Martin S.T., Russell L.M., Buseck P.R. Phase transitions of single salt particles studied using a transmission electron microscope with an environmental cell. Aerosol Science and Technology 2005, 39:849-856.
    • (2005) Aerosol Science and Technology , vol.39 , pp. 849-856
    • Wise, M.E.1    Biskos, G.2    Martin, S.T.3    Russell, L.M.4    Buseck, P.R.5
  • 17
    • 36149075804 scopus 로고
    • Determination of the single-scattering probability distribution from plural-scattering data
    • Johnson D., Spence J. Determination of the single-scattering probability distribution from plural-scattering data. Journal of Physics D 1974, 7:771-780.
    • (1974) Journal of Physics D , vol.7 , pp. 771-780
    • Johnson, D.1    Spence, J.2
  • 19
    • 58149396410 scopus 로고    scopus 로고
    • Electron energy-loss spectroscopy in the TEM
    • Egerton R.F. Electron energy-loss spectroscopy in the TEM. Reports on Progress in Physics 2009, 72:16502-16525.
    • (2009) Reports on Progress in Physics , vol.72 , pp. 16502-16525
    • Egerton, R.F.1
  • 20
    • 0034323276 scopus 로고    scopus 로고
    • Inner shell excitation spectroscopy of molecules using inelastic electron scattering
    • Hitchcock A.P. Inner shell excitation spectroscopy of molecules using inelastic electron scattering. Journal of Electron Spectroscopy and Related Phenomena 2000, 112:9-29.
    • (2000) Journal of Electron Spectroscopy and Related Phenomena , vol.112 , pp. 9-29
    • Hitchcock, A.P.1
  • 23
    • 36749115628 scopus 로고
    • K, L and M shell generalized oscillator strengths and ionization cross sections for fast electron collisions
    • Leapman R.D., Rez P., Meyers D.F. K, L and M shell generalized oscillator strengths and ionization cross sections for fast electron collisions. Journal of Chemical Physics 1980, 72:11-29.
    • (1980) Journal of Chemical Physics , vol.72 , pp. 11-29
    • Leapman, R.D.1    Rez, P.2    Meyers, D.F.3
  • 24
    • 0021898581 scopus 로고
    • Inner shell edge profiles in electron energy loss spectroscopy
    • Ahn C.C., Rez P. Inner shell edge profiles in electron energy loss spectroscopy. Ultramicroscopy 1985, 17:105.
    • (1985) Ultramicroscopy , vol.17 , pp. 105
    • Ahn, C.C.1    Rez, P.2
  • 26
    • 0001957705 scopus 로고
    • Quantification of electron energy-loss spectra with K-shell and L-shell ionization cross sections
    • Hofer F., Golob P. Quantification of electron energy-loss spectra with K-shell and L-shell ionization cross sections. Micron and Microscopica Acta 1988, 19:73-86.
    • (1988) Micron and Microscopica Acta , vol.19 , pp. 73-86
    • Hofer, F.1    Golob, P.2
  • 27
    • 0000522860 scopus 로고
    • Determination of inner-shell cross section for EELS quantification
    • Hofer F. Determination of inner-shell cross section for EELS quantification. Microscopy Microanalysis Microstructures 1991, 2:215-230.
    • (1991) Microscopy Microanalysis Microstructures , vol.2 , pp. 215-230
    • Hofer, F.1
  • 28
    • 33646667401 scopus 로고
    • Orientation dependence of core edges from anisotropic materials determined by inelastic scattering of fast electrons
    • Leapman R.D., Fejes P.L., Silcox J. Orientation dependence of core edges from anisotropic materials determined by inelastic scattering of fast electrons. Physical Review B 1983, 28:2361-2373.
    • (1983) Physical Review B , vol.28 , pp. 2361-2373
    • Leapman, R.D.1    Fejes, P.L.2    Silcox, J.3
  • 29
    • 0018226653 scopus 로고
    • Formulae for light element microanalysis by electron energy-loss spectroscopy
    • Egerton R.F. Formulae for light element microanalysis by electron energy-loss spectroscopy. Ultramicroscopy 1978, 3:243-251.
    • (1978) Ultramicroscopy , vol.3 , pp. 243-251
    • Egerton, R.F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.