Improving energy resolution of EELS spectra by deconvolution using maximum-entropy and Richardson-Lucy algorithms

Microscopy and Microanalysis

Volumn 9, Issue SUPPL. 2, 2003, Pages 832-833

  Ishizuka, Kazuo ^a,b   Kimoto, Koji ^b   Bando, Yoshio ^b  

^a Higashimatsuyama   (Japan)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042422072     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927603444164     Document Type: Conference Paper

References (6)

1. P.C. Tiemeijer et al., Proc. of MSA (2001), Long Beach, CA, 1130-1131.
2. R. Kuzuo, M. Tanaka, J. of Electron Micros. 42 (1993) 240-243.
3. M.H.F. Overwijk, D. Reefman, Micron 31 (2000) 325-331.
4. A. Gloter, A. Douiri, M. Tencé, C. Colliex, submitted to Ultramicroscopy.
5. Gatan R&D.
6. K. Kimoto, Y. Matsui, J. of Micorsc. 208 (2002) 224-228.