SCOPUS 정보 검색 플랫폼

JOM

Volumn 62, Issue 12, 2010, Pages 53-57

Atomic-scale STEM-EELS mapping across functional interfaces

(6) Colliex, Christian a Bocher, Laura a De La Peňa, Francisco a Gloter, Alexandre a March, Katia a Walls, Michael a

a UNIVERSITÉ PARIS SUD (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC COLUMNS; ATOMIC SCALE; BONDING STATE; DARK FIELD IMAGES; ELECTRON PROBE; ENERGY RESOLUTIONS; FUNCTIONAL INTERFACE; HETEROLAYERS; INCIDENT BEAMS; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SPINTRONICS; STEM-EELS; STRUCTURAL ARRANGEMENT;

ATOMS; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 78650901966 PISSN: 10474838 EISSN: 15431851 Source Type: Journal
DOI: 10.1007/s11837-010-0181-9 Document Type: Article

Times cited : (11)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.