High spatial resolution semi-automatic crystallite orientation and phase mapping of nanocrystals in transmission electron microscopes

Crystal Research and Technology

Volumn 46, Issue 6, 2011, Pages 589-606

  Moeck, P ^a,b   Rouvimov, S ^a,b   Rauch, E F ^c   Veron M ^c   Kirmse, H ^d   Hausler I ^d   Neumann, W ^d   Bultreys, D ^e   Maniette, Y ^e   Nicolopoulos, S ^e  

^a PORTLAND STATE UNIVERSITY   (United States)

^b Oregon Nanoscience and Microtechnologies Institute   (United States)

^c CNRS   (France)

^d HUMBOLDT UNIVERSITY   (Germany)

^e NanoMEGAS   (Belgium)

Author keywords

crystallite orientation; high resolution transmission electron microscopy; phase mapping; precession electron diffraction; structural characterization

Indexed keywords

CRYSTALLITE ORIENTATION; PHASE MAPPING; PRECESSION ELECTRON DIFFRACTION; STRUCTURAL CHARACTERIZATION; TRANSMISSION ELECTRON;

CRYSTAL ORIENTATION; ELECTRON BEAMS; ELECTRON DIFFRACTION; ELECTRON MICROSCOPES; ELECTRONS; FOURIER TRANSFORMS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INTERFACES (MATERIALS); MANGANESE COMPOUNDS; MAPPING; MODEL STRUCTURES; NANOCRYSTALLINE ALLOYS; NANOCRYSTALS; POLYCRYSTALLINE MATERIALS; TRANSMISSION ELECTRON MICROSCOPY;

CRYSTALLITES;

EID: 79957985033     PISSN: 02321300     EISSN: 15214079     Source Type: Journal    
DOI: 10.1002/crat.201000676     Document Type: Conference Paper

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