Single photon detectors for ultra low voltage time-resolved emission measurements

IEEE Journal of Quantum Electronics

Volumn 47, Issue 6, 2011, Pages 841-848

  Stellari, Franco ^a   Song, Peilin ^a   Weger, Alan J ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Picosecond imaging for circuit analysis; single photon avalanche photodiode; superconducting single photon detector; time resolved emission

Indexed keywords

CIRCUIT ANALYSIS; COMPLEMENTARY METAL OXIDE SEMICONDUCTORS; ELECTRICAL SIGNAL; LOW-VOLTAGE APPLICATIONS; NON-INVASIVE; SINGLE PHOTON AVALANCHE PHOTODIODE; SINGLE-PHOTON AVALANCHE PHOTODIODES; SINGLE-PHOTON DETECTORS; STATE OF THE ART; SUPERCONDUCTING SINGLE-PHOTON DETECTOR; SUPERCONDUCTING SINGLE-PHOTON DETECTORS; SUPPLY VOLTAGE REDUCTION; TEST VEHICLE; TIME-RESOLVED EMISSION; TIME-RESOLVED EMISSIONS; ULTRA-LOW-VOLTAGE; VERY-LARGE-SCALE INTEGRATION;

AVALANCHE PHOTODIODES; DETECTORS; ELECTRIC NETWORK ANALYSIS; PHOTODETECTORS; PHOTODIODES; PHOTONS; SUPERCONDUCTIVITY;

PARTICLE BEAMS;

EID: 79955634182     PISSN: 00189197     EISSN: None     Source Type: Journal    
DOI: 10.1109/JQE.2011.2129493     Document Type: Article

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