Characterization of a 0.13 μm CMOS link chip using time resolved emission (TRE)

Microelectronics Reliability

Volumn 45, Issue 9-11, 2005, Pages 1550-1553

  Stellari, Franco ^a   Song, Peilin ^a   Hryckowian, John ^b   Torreiter, Otto A ^c   Wilson, Steve ^b   Wu, Phil ^b   Tosi, Alberto ^d  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b IBM   (United States)

^c IBM   (Germany)

^d POLITECNICO DI MILANO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DELAY CHAINS; PICOSECOND IMAGING CIRCUIT ANALYSIS (PICA); SELF TIMING INTERFACES (STI); SUPERCONDUCTING SINGLE-PHOTON DETECTORS (SSPD);

IMAGING TECHNIQUES; MICROPROCESSOR CHIPS; PHOTONS; SUPERCONDUCTING DEVICES; TIMING CIRCUITS;

CMOS INTEGRATED CIRCUITS;

EID: 24144491601     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2005.07.062     Document Type: Conference Paper

References (14)

1. J.A. Kashand, and J.C. Tsang Full chip optical imaging of logic state evolution in CMOS circuits International Electron Device Meeting 1996 934 936
2. P. Song Diagnostic techniques for the IBM S/390 600MHz G5 microprocessor International Test Conference 600 1999 1073 1082
3. F. Stellari, P. Song, T. Xia, and A.J. Weger Broken scan chain diagnostics based on time-integrated and time-dependent emission measurements International Symposium for Testing and Failure Analysis 2004 52 57
4. F. Stellari, P. Song, A.J. Weger, and M.K. McManus Tirne-resolved optical measurements from 0.13 m CMOS technology microprocessor using a superconducting single-photon detector International Symposium for Testing and Failure Analysis 2003 40 44
5. E.W. Chencinski The structure of chips and links comprising the IBM eServer z990 I/O subsystem IBMJ Res & Dev 48 4 2004 449 459
6. D.J. Stigliani IBM eServer z900 I/O Subsystem IBMJ Res & Dev 46 4/5 2002 421 445
7. P. Maki Processor subsystem interconnect architecture for a large symmetric multiprocessing system IBMJ Res & Dev 48 4 2004 323 337
8. T.M. Winkel First- and second-level packaging of the z990 processor cage IBM J Res & Dev 48 4 2004 379 394
9. D.G. Bair Functional verification of the z990 superscalar, multi-book microprocessor complex IBM J Res & Dev 48 4 2004 347 365
10. B. Hoppe Functional verification of a frequency-programmable switch chip with asynchronous clock sections IBM J Res & Dev 48 4 2004 461 474
11. W.K. Lo Next-generation optical probing tools for design debug of high speed integrated circuits International Symposium for Testing and Failure Analysis 2002 753 762
12. F. Stellari, and P. Song Testing of Ultra Low Voltage VLSI Chips using the Superconducting Single-Photon Detector (SSPD) European Symposium on Reliability of Electron Devices 2004 1663 1668
13. W.G. McMullan, S. Charbonneau, and M.L.W. Thewalt Simultaneous subnanosecond timing information and 2D spatial information from imaging photomultiplier tubes Review of Scientific Instruments 58 9 1987 1626 1628
14. J. Vickers, N. Pakdaman, and S. Kasapi Prospects of time-resolved photon emission as a debug tool Int Symp On Testing and Failure Analysis 28 2002 645 653