Spectrally- and temporally-resolved dynamic emission from CMOS ICs

Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

Volumn 2, Issue , 2003, Pages 598-599

  Woods, Gary L ^a   Kasapi, Steven ^a  

^a Optonics Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION GRATINGS; FAILURE ANALYSIS; HOT CARRIERS; INTEGRATED CIRCUIT MANUFACTURE; INTEGRATED CIRCUIT TESTING; LIGHT EMISSION; LUMINESCENCE; OPTICAL MICROSCOPY; PHOTONS; PROBES; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SEMICONDUCTING SILICON; CMOS INTEGRATED CIRCUITS; LIGHT;

HOT CARRIER LUMINESCENSE; OPTICAL PROBER;

CMOS INTEGRATED CIRCUITS; HOT CARRIERS;

BLACK BODY; BLUE SHIFT; CMOS GATE; DRAIN-SOURCE VOLTAGE; HOT CARRIER LUMINESCENCE; HOT-CARRIERS; SPECTRA'S; SPECTRAL BEHAVIORS; TEMPORAL BEHAVIOR; TEMPORALLY RESOLVED;

EID: 0344897647     PISSN: 10928081     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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