Off-state luminescence in metal-oxide-semiconductor field-effect transistors and Its use as on-chip voltage probe

Applied Physics Letters

Volumn 85, Issue 12, 2004, Pages 2390-2392

  Polonsky, Stas ^a   Weger, Alan ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ON-CHIP VOLTAGE PROBE; PARASITIC EFFECTS; POWER SUPPLY NOISE; SIGNAL INTEGRITY;

CROSSTALK; ELECTRIC POTENTIAL; LEAKAGE CURRENTS; LUMINESCENCE; MICROPROCESSOR CHIPS; MOS DEVICES; POWER SUPPLY CIRCUITS; SPURIOUS SIGNAL NOISE;

FIELD EFFECT TRANSISTORS;

EID: 7044274238     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1796520     Document Type: Article

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