Time-Resolved Optical Measurements from 0.13μm CMOS Technology Microprocessor using a Superconducting Single-Photon Detector

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn 2003-November, Issue , 2003, Pages 40-44

  Stellari, Franco ^a   Song, Peilin ^a   Weger, Alan J ^a   McManus, Moyra K ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AVALANCHE PHOTODIODES; CMOS INTEGRATED CIRCUITS; OPTICAL DATA PROCESSING; PHOTONS;

% REDUCTIONS; ACQUISITION TIME; CMOS TECHNOLOGY; OPTICAL WAVEFORM; PERFORMANCE; PROTOTYPE VERSIONS; SUPERCONDUCTING SINGLE-PHOTON DETECTORS; SUPPLY VOLTAGES; TIME-RESOLVED OPTICAL MEASUREMENT; WAVEFORMS;

PARTICLE BEAMS;

EID: 4444318779     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.31399/asm.cp.istfa2003p0040     Document Type: Conference Paper

References (13)

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