Timing analysis of a microprocessor PLL using high quantum efficiency Superconducting Single Photon Detector (SSPD)

Proceedings of the 30th International Symposium for Testing and Failure Analysis, ISTFA 2004

Volumn , Issue , 2004, Pages 197-202

  Song, Peilin ^a   Stellari, Franco ^a   Eckhardt, James P ^b   McNamara, Timothy ^b   Tong, Ching Lung ^b  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; DETECTORS; PHOTONS; QUANTUM EFFICIENCY; SILICON ON INSULATOR TECHNOLOGY; SUPERCONDUCTING DEVICES;

NEAR-INFRARED (NIR) LUMINESCENCE; PHYSICAL FAILURE ANALYSIS (PFA); PICOSECOND IMAGING CIRCUIT ANALYSIS (PICA); SUPERCONDUCTING SINGLE-PHOTON DETECTOR (SSPD);

PHASE LOCKED LOOPS;

EID: 10444255571     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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