Testing of ultra low voltage VLSI chips using the superconducting single-photon detector (SSPD)

Microelectronics Reliability

Volumn 44, Issue 9-11 SPEC. ISS., 2004, Pages 1663-1668

  Stellari, Franco ^a   Song, Peilin ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; ELECTRIC FIELDS; ELECTRIC NETWORK ANALYSIS; FIELD EFFECT TRANSISTORS; INFRARED RADIATION; LIGHT EMISSION; MICROPROCESSOR CHIPS; PHOTOMULTIPLIERS; PHOTONS;

ARRAY BUILT IN SELF TEST (ABIST); NEAR INFRARED LIGHT (NIR); OFF STATE LEAKAGE CURRENTS; SUPERCONDUCTING SINGLE PHOTON DETECTORS (SSPD);

VLSI CIRCUITS;

EID: 4544322721     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2004.07.050     Document Type: Conference Paper

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