SCOPUS 정보 검색 플랫폼

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn , Issue , 2002, Pages 741-746

Single Element Time Resolved Emission Probing for Practical Microprocessor Diagnostic Applications

(6) Varner, Elizabeth B a Young, Chi Lin a Ng, Hung M a Maher, Steven P a Eiles, Travis M a Lee, Birk b

a INTEL CORPORATION (United States)

b Optonics Inc (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LASER VOLTAGE PROBING (LVP); TIME RESOLVED EMISSION (TRE);

ANTIREFLECTION COATINGS; IMAGING TECHNIQUES; INFORMATION ANALYSIS; PHOTONS; QUANTUM EFFICIENCY; SIGNAL TO NOISE RATIO; SILICON; SYNCHRONIZATION; TRANSISTORS; WAVEFORM ANALYSIS;

MICROPROCESSOR CHIPS;

EID: 1542300258 PISSN: None EISSN: None Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper

Times cited : (27)

References (10)

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2
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3
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- Wilsher, K.R.¹ Lo, W.K.²

4
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- Tsang, I.C.¹ Kash, J.A.² Vallet, D.P.³

5
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- W. Lo, S. Kasapi, and K. Wilsher, Proceedings, ISTFA, 33 (2001).
- (2001) Proceedings, ISTFA , pp. 33
- Lo, W.¹ Kasapi, S.² Wilsher, K.³

6
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- M. Bruce, R.R. Goruganthu, S. McBride, D. Bethke, and J.M. Chin, Proceedings, ISTFA, 23 (2001).
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7
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- Somani, S.¹ Kasapi, S.² Wilsher, K.³ Lo, W.⁴ Sobolewski, R.⁵ Gol'tsman, G.⁶

8
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9
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- S. Tyagi, M. Alavi, R. Bigwood, T. Bramblett, J. Brandenburg, W. Chen, B. Crew, M. Hussein, P. Jacob, C. Kenyon, C. Lo, B. McIntyre, Z. Ma, P. Moon, P. Nguyen, L. Rumaner, R. Schweinfurth, S. Sivakumar, M. Stettler, S. Thompson, B. Tufts, J. Xu, S. Yang, and M. Bohr, Technical Digest, International Electron Devices Meeting, 567-570 (2000).
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- Eiles, T.M.¹ Hunt, D.² Chi, D.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.