Testing and diagnostics of CMOS circuits using light emission from off-state leakage current

IEEE Transactions on Electron Devices

Volumn 51, Issue 9, 2004, Pages 1455-1462

  Stellari, Franco ^a   Song, Peilin ^a   Tsang, James C ^a   McManus, Moyra K ^a   Ketchen, Mark B ^a  

^a IEEE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTERNAL VOLTAGE DROP; OFF STATE LEAKAGE CURRENT; PICOSECOND IMAGING CIRCUIT ANALYSIS; POWER DISTRIBUTION GRIDS;

CMOS INTEGRATED CIRCUITS; ELECTRIC POTENTIAL; IMAGE ANALYSIS; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING; LEAKAGE CURRENTS; LIGHT EMISSION; PHOTODETECTORS; ULSI CIRCUITS;

MOSFET DEVICES;

EID: 4444250850     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2004.833967     Document Type: Article

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