PC Card Based Optical Probing of Advanced Graphics Processor using Time Resolved Emission

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn 2003-November, Issue , 2003, Pages 36-39

  Marks, Howard Lee ^a   Ton, Tung ^a   Block, Jeffrey A ^b   Kasapi, Steven ^b   Shaw, Chris ^b  

^a NVIDIA   (United States)

^b Optonics Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; DESIGN FOR TESTABILITY; INTEGRATED CIRCUITS; MICROELECTRONICS;

DEVICES UNDER TESTS; GRAPHIC PROCESSORS; INTERCONNECTION LAYERS; INTERNAL NODES; MICROELECTRONIC INDUSTRY; OPTICAL PROBING; PC CARD; PROBING TECHNOLOGIES; SILICON INTEGRATED CIRCUITS; TIME-RESOLVED EMISSIONS;

EQUIPMENT TESTING;

EID: 4544367672     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.31399/asm.cp.istfa2003p0036     Document Type: Conference Paper

References (6)

1. J. C. Tsang, J. A. Kash, and D. P. Vallett, "Optical tools for measuring timing and switching in silicon ICs: Status and future challenges, " in IEEE Industrial Research Highlights, vol. 2001: IEEE, 2001.
2. J. A. Kash and J. C. Tsang, "Dynamic Internal Testing of CMOS Circuits Using Hot Luminescence, " IEEE Electron Device Letters, vol. 18, pp. 330-332, 1997.
3. S. Kasapi, C.-C. Tsao, K. Wilsher, W. Lo, and S. Somani, "Laser Beam Backside Probing of CMOS Integrated Circuits, " Microelectronics Reliability, vol. 39, pp. 957-61, 1999.
4. J. Vickers, N. Pakdaman, and S. Kasapi, "Prospects of Time-Resolved Photon Emission as a Debug Tool, " presented at ISTFA, Phoenix, AZ, 2002.
5. E. B. Varner, C.-L. K. Young, H. M. P. Ng, S. P. Maher, and T. M. Eiles, "Single Element Time Resolved Emission Probing for Practical Microprocessor Diagnostic Applications, " presented at 28th International Symposium for Testing and Failure Analysis, Phoenix, AZ, 2002.
6. E. B. Dan Bodoh, Kris Dickson, Ron Wang, Tim Cheng and J. V. Nader Pakdaman, Dan Cotton, and Birk Lee, "Defect Localization Using Time-Resolved Photon Emission on SOI Devices that Fail Scan Tests, " presented at International Symposium on Testing and Failure Analysis, Phoenix, AZ, 2002.