Time-resolved photon counting system based on a Geiger-mode InGaAs/InP APD and a solid immersion lens

Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

Volumn 2, Issue , 2003, Pages 600-601

  Vickers, James S ^a   Ispasoiu, Radu ^a   Cotton, Daniel ^a   Frank, Jonathan ^a   Lee, Birk ^a   Kasapi, Steven ^a  

^a Optonics Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AVALANCHE DIODES; COOLING; LENSES; LIGHT EMISSION; PHOTODIODES; PHOTONS; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SEMICONDUCTING INDIUM PHOSPHIDE; PHOTONICS; SEMICONDUCTING INDIUM;

INFRARED PHOTONS; SOLID IMMERSION LENS; TIME RESOLVED PHOTON COUNTING SYSTEM;

CMOS INTEGRATED CIRCUITS; NANOSTRUCTURES;

GEIGER MODES; KEY SYSTEMS; PHOTON COUNTING SYSTEM; PHOTON-COUNTING MODE; SOLID IMMERSION LENS; SYSTEM FEATURES; TIME-RESOLVED EMISSIONS; TIME-RESOLVED PHOTONS;

EID: 0344897641     PISSN: 10928081     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

1. S. Polonsky, A. Weger, and M. McManus, "Picosecond Imaging Circuit Analysis of Leakage Currents in CMOS Circuits," Proceedings from the 28th International Symposium for Testing and Failure Analysis, pp. 387-390, 2002.
2. Y. Taur and T. H. Ning, Fundamentals of modern VLSI devices. New York, NY: Cambridge University Press, 1998.
3. J. A. Kash and J. C. Tsang, "Dynamic Internal Testing of CMOS Circuits Using Hot Luminescence," IEEE Electron. Dev. Lett., vol. 18, pp. 330-332, 1997.
4. E. B. Varner, C.-L. K. Young, H. M. P. Ng, S. P. Maher, and T. M. Eiles, "Single Element Time Resolved Emission Probing for Practical Microprocessor Diagnostic Applications," Proceedings of the 28th International Symposium for Testing and Failure Analysis, pp. 741-746, 2002.
5. J. Vickers, N. Pakdaman, and S. Kasapi, "Prospects of Time-Resolved Photon Emission as a Debug Tool," Proceeding of the 28th International Conference on Testing and Failure Analysis, pp. 645-653, 2002.
6. S. Ansari, T. Cader, N. Stoddard, B. Tolman, J. Frank, D. Cotton, T. Wong, and N. Pakdaman, "Spray cooling thermal management of a semiconductor undergoing probing, diagnostics, and failure analysis," Proceedings of the International Electronic Packaging Technical Conference and Exhibition (InterPACK), pp. (to be published), 2003.
7. A. Lacaita, F. Zappa, S. Cova, and P. Lovati, "Single photon detection beyond 1 μm: performance of commercially available InGaAs/InP detectors," Appl. Opt., vol. 35, pp. 2986-2996, 1996.
8. J. G. Rarity, T. E. Wall, K. D. Ridley, P. C. M. Owens, and P. T. Tapster, "Single-photon counting for the 1300-1600-nm range by use of Peltier-cooled and passively quenched InGaAs avalanche photodiodes," Appl. Opt., vol. 39, pp. 6746-6753, 2000.