Dynamic internal testing of CMOS circuits using hot luminescence

IEEE Electron Device Letters

Volumn 18, Issue 7, 1997, Pages 330-332

  Kash, J A ^a   Tsang, J C ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAMS; GATES (TRANSISTOR); HOT CARRIERS; INTEGRATED CIRCUIT TESTING; LUMINESCENCE OF SOLIDS; MICROSCOPES; OSCILLATORS (ELECTRONIC); PERSONAL COMPUTERS; PHOTOCATHODES; PHOTODETECTORS; PHOTONS;

HOT ELECTRON LUMINESCENCE TESTING;

CMOS INTEGRATED CIRCUITS;

EID: 0031186149     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/55.596927     Document Type: Article

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