Advanced optical test of an array an 65 nm CMOS technology

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn 2005, Issue , 2005, Pages 355-362

  Stellari, Franco ^a   Song, Peilin ^a   Christensen, Todd A ^b  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL PACKAGING; SOI CMOS TECHNOLOGY; SUPERCONDUCTING SINGLE-PHOTON DETECTOR; WIRE-BONDING;

CMOS INTEGRATED CIRCUITS; LOGIC CIRCUITS; READOUT SYSTEMS; SUPERCONDUCTING DEVICES;

OPTICAL TESTING;

EID: 33645673244     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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