Switching time extraction of CMOS gates using time-resolved emission (TRE)

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2006, Pages 566-573

  Stellari, Franco ^a   Tosi, Alberto ^b   Song, Peilin ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b POLITECNICO DI MILANO   (Italy)

Author keywords

Emission model; Fall time; Picosecond Imaging Circuit Analysis (PICA); Rise time; Slew rate; Switching time; Time Resolved Emission (TRE)

Indexed keywords

OPTICAL WAVEFORMS; PICOSECOND IMAGING; TIME RESOLVED EMISSION (TRE); TRANSISTOR CHANNELS;

CMOS INTEGRATED CIRCUITS; ELECTRIC NETWORK ANALYSIS; LUMINESCENCE; SWITCHING; VLSI CIRCUITS;

GATES (TRANSISTOR);

EID: 34250790716     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2006.251280     Document Type: Conference Paper

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