Defect Localization Using Time-Resolved Photon Emission on SOI Devices that Fail Scan Tests

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn , Issue , 2002, Pages 655-661

  Bodoh, Dan ^a   Black, Ed ^a   Dickson, Kris ^a   Wang, Ron ^a   Cheng, Tim ^a   Pakdaman, Nader ^b   Vickers, Jim ^b   Cotton, Dan ^b   Lee, Birk ^b  

^a MOTOROLA INC   (United States)

^b Optonics Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL WAVEFORMS; PHOTON EMISSION;

ABSORPTION; ELECTROMIGRATION; ELECTRON EMISSION; FAILURE ANALYSIS; GRAPHICAL USER INTERFACES; IMAGING SYSTEMS; INTEGRATED CIRCUITS; LIGHT REFLECTION; OPTICAL SYSTEMS; OPTIMIZATION; QUANTUM EFFICIENCY; SPURIOUS SIGNAL NOISE;

SILICON ON INSULATOR TECHNOLOGY;

EID: 1542300263     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

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