An advanced optical diagnostic technique of IBM z990 eServer microprocessor

Proceedings - International Test Conference

Volumn 2005, Issue , 2005, Pages 1227-1235

  Song, Peilin ^a   Stellari, Franco ^a   Huott, Bill ^b   Wagner, Otto ^b   Srinivasan, Uma ^b   Chan, Yuen ^b   Rizzolo, Rick ^b   Nam, H J ^b   Eckhardt, Jim ^b   McNamara, Tim ^b   Tong, Ching Lung ^b   Weger, Alan ^a   McManus, Moyra ^b  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN FOR DIAGNOSTICS (DFD); OPTICAL DIAGNOSTICS; PICOSECOND IMAGING CIRCUIT ANALYSIS (PICA); SUPERCONDUCTING SINGLE PHOTON DETECTOR (SSPD);

DESIGN FOR TESTABILITY; IMAGING SYSTEMS; OPTICAL SYSTEMS; PARTICLE DETECTORS; SERVERS; TURNAROUND TIME;

MICROPROCESSOR CHIPS;

EID: 33847126869     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2005.1584091     Document Type: Conference Paper

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