Picosecond Imaging Circuit Analysis of Leakage Currents in CMOS Circuits

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn , Issue , 2002, Pages 387-390

  Polonsky, Stas ^a   Weger, Alan ^a   McManus, Moyra ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; CMOS INTEGRATED CIRCUITS; ELECTRIC POTENTIAL; IMAGING SYSTEMS; LEAKAGE CURRENTS; LIGHT EMISSION; MOSFET DEVICES; OPTIMIZATION; PARTICLE DETECTORS; PHOTONS;

PHOTON EMISSION MICROSCOPY (PEM); VOLTAGE DROP;

ELECTRIC NETWORK ANALYSIS;

EID: 0037508170     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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