Voltage noise and jitter measurement using time-resolved emission

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn 2006, Issue , 2006, Pages 438-443

  Kasapi, Steven ^a   Woods, Gary L ^a  

^a Credence Systems Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTERPULSE TIMING; JITTER MEASUREMENT; TIME RESOLVED EMISSION (TRE); VOLTAGE NOISE;

CORRELATION METHODS; ELECTRIC POTENTIAL; ELECTRIC POWER SYSTEMS; JITTER; WAVEFORM ANALYSIS;

SPURIOUS SIGNAL NOISE;

EID: 33847644903     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)

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