Next-Generation Optical Probing Tools for Design Debug of High Speed Integrated Circuits

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn , Issue , 2002, Pages 753-762

  Lo, William ^a   Wilsher, Kenneth ^a   Malinsky, Richard ^a   Boiadjieva, Nina ^a   Tsao, Chun Cheng ^a   Leibowitz, Martin ^a   Deslandes, Hervé ^a  

^a SCHLUMBERGER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; IMAGING TECHNIQUES; JITTER; LASER BEAMS; OPTICAL SYSTEMS; OPTIMIZATION; PHOTONS; TRANSISTORS; WAVEFORM ANALYSIS;

LASER VOLTAGE PROBING (LVP); SINGLE-PHOTON DETECTOR (SSPD); TIME-RESOLVED PHOTON EMISSION (TRPE);

CMOS INTEGRATED CIRCUITS;

EID: 0344091932     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (23)

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9. InGaAs-APD specifications taken from id Quantique's data sheet and applications notes for their 1.3 μm and 1.55 μm Single-Photon Detector Module. http://www. idquantique.com/spcm.html.
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12. Super S25 specifications taken from Quantar's data sheet for their 2601B Mepsicron II detector. http://www.quantar.com.
13. Si-APD specifications taken from Perkin Elmers' data sheet for their Single Photon Counting Module (SPCM). http://optoelectronics.perkinelmer.com.
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15. InGaAs-PMT specifications taken from Hamamatsu's data sheet for their R3809U-68, 69 detector, http://usa.hamamatsu.com.
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21. Ribordy, G., et al., Performance of InGaAs/InP Avalance Photodiodes as Gated-Mode Photon Counters. Applied Optics, 1998. 37(12): p. 2272-7.
22. Boggess, T.F., et al., Nonlinear Refraction in Silicon Induced by One-Micron Picosecond Pulses. Optical Communications, 1987. 64(4): p. 387.
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