Time-Resolved Photoemission Electron Microscopy

Advances in Imaging and Electron Physics

Volumn 142, Issue , 2006, Pages 159-323

  Schonhense G ^a   Elmers, H J ^a   Nepijko, S A ^a   Schneider, C M ^b  

^a JOHANNES GUTENBERG UNIVERSITY   (Germany)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS; FERROMAGNETIC MATERIALS; LASERS; MAGNETIC FIELDS; MAGNETIC THIN FILMS; MAGNETIZATION; NANOSTRUCTURED MATERIALS; NUCLEATION; PHOTOEMISSION; RADIATION;

DOMAIN WALLS; PHOTOELECTRON EMISSION INTENSITY; PHOTOEMISSION ELECTRON MICROSCOPY (PEEM); SURFACE PLASMON ENHANCED PHOTOEXCITATION; WAVE FUNCTIONS;

ELECTRON MICROSCOPY;

EID: 33745603067     PISSN: 10765670     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S1076-5670(05)42003-0     Document Type: Review

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