Visualization of field induced ferroelectric electron emission from TGS using emission electron microscopy

Applied Physics A: Materials Science and Processing

Volumn 78, Issue 1, 2004, Pages 67-72

  Klais, M ^a   Averty, D ^b   Gundel, H W ^b   Schonhense G ^a  

^a JOHANNES GUTENBERG UNIVERSITY   (Germany)

^b UNIVERSITÉ DE NANTES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; ELECTRIC POTENTIAL; ELECTRODES; ELECTRON EMISSION; ELECTRON MICROSCOPY; ELECTROOPTICAL DEVICES; FERROELECTRIC MATERIALS; OPTICAL INSTRUMENT LENSES; PHOTOEMISSION;

CRYSTAL TEMPERATURE; MAGNIFICATION;

SINGLE CRYSTALS;

EID: 0742303163     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00339-003-2219-0     Document Type: Article

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