X-ray spectromicroscopy of polymers and tribological surfaces at beamline X1A at the NSLS

Journal of Electron Spectroscopy and Related Phenomena

Volumn 84, Issue 1-3, 1997, Pages 53-72

  Ade, H ^a   Smith, A P ^a   Zhang, H ^a   Zhuang, G R ^a,b   Kirz, J ^c   Rightor, E ^d   Hitchcock, A ^e  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c STONY BROOK UNIVERSITY   (United States)

^d DOW CHEMICAL COMPANY   (United States)

^e MCMASTER UNIVERSITY   (Canada)

Author keywords

NEXAFS; Polymers; Spectroscopy; Tribology; X ray microscopy; XPS

Indexed keywords

POLYMERS; SURFACES; TRIBOLOGY; X RAY MICROSCOPES; X RAYS;

MICROSPECTROSCOPY; NEAR EDGE X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; SCANNING PHOTOEMISSION MICROSCOPE; SCANNING TRANSMISSION X RAY MICROSCOPE; X RAY SPECTROMICROSCOPY;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0031096528     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(97)00013-3     Document Type: Article

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