The lateral photoemission distribution from a defined cluster/substrate system as probed by photoemission electron microscopy

New Journal of Physics

Volumn 7, Issue , 2005, Pages

  Munzinger, M ^a   Wiemann, C ^a   Rohmer, M ^a   Guo, L ^a   Aeschlimann, M ^a   Bauer, M ^a  

^a France   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

HIGHLY ORIENTED PYROLYTIC GRAPHITE (HOPG); PHOTOEMISSION ELECTRON MICROSCOPY; SUBSTRATE SYSTEM; THRESHOLD PHOTOEMISSION;

ELECTRON MICROSCOPY; ELEMENTARY PARTICLES; LASERS; LIGHT POLARIZATION; REDUCTION; SCANNING TUNNELING MICROSCOPY; SILVER; SUBSTRATES;

PHOTOEMISSION;

EID: 23244436592     PISSN: 13672630     EISSN: 13672630     Source Type: Journal    
DOI: 10.1088/1367-2630/7/1/068     Document Type: Article

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