Orbital mapping of carbon thin films by XANES-spectromicroscopy

Journal of Electron Spectroscopy and Related Phenomena

Volumn 107, Issue 3, 2000, Pages 261-271

  Ziethen, C ^a   Schmidt, O ^a   Marx, G K L ^a   Schonhense G ^a   Fromter R ^b   Gilles, J ^b   Kirschner, J ^b   Schneider, C M ^c   Groning O ^d  

^a JOHANNES GUTENBERG UNIVERSITY   (Germany)

^b MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^c D 01171   (Germany)

^d UNIVERSITY OF FRIBOURG   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; AMORPHOUS FILMS; CHEMICAL BONDS; DIAMOND FILMS; ELECTRON ENERGY LEVELS; ELECTRON MICROSCOPY; ELECTRONIC DENSITY OF STATES; GRAPHITE; MOLECULAR STRUCTURE; PHOTOEMISSION; THIN FILMS; X RAY SPECTROSCOPY;

ORBITAL MAPPING; PHOTOEMISSION ELECTRON MICROSCOPY (PEEM); SPECTROMICROSCOPY; X RAY ABSORPTION NEAR EDGE STRUCTURE (XANES) SPECTROSCOPY;

CARBON;

EID: 0034207512     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0368-2048(00)00151-1     Document Type: Article

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