Multi-technique application of a double reflection electron emission microscope

Surface Science

Volumn 454, Issue 1, 2000, Pages 1094-1098

  Grzelakowski, Krzysztof ^a  

^a FOCUS GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER MOBILITY; ELECTRON REFLECTION; ELECTRON TRANSITIONS; ELECTRON TRANSPORT PROPERTIES; LOW ENERGY ELECTRON DIFFRACTION;

LOW-ENERGY ELECTRON MICROSCOPY (LEEM); MIRROR ELECTRON MICROSCOPY (MEM); PHOTOELECTRON EMISSION MICROSCOPY (PEEM);

SINGLE CRYSTALS;

EID: 0033689010     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00197-7     Document Type: Article

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