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Volumn 84, Issue 1-3, 1997, Pages 211-229

A photoemission microscope with a hemispherical capacitor energy filter

Author keywords

Electron spectroscopy; ESCA; Microscopy; PEEM; Photoemission

Indexed keywords


EID: 0000162137     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(97)00005-4     Document Type: Article
Times cited : (42)

References (37)
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    • Wardell, I.R.M.1    Coxon, P.A.2
  • 7
    • 0345784922 scopus 로고    scopus 로고
    • U.S. Patent 4 810 880, 7 March 1989
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    • Gerlach, R.L.1
  • 9
    • 36549104899 scopus 로고
    • G. Harp, B.P. Tonner, Rev. Sci. Instrum. 59 (1988) 853. B.P. Tonner, G.R. Harp, S.F. Koranda, J. Zhang, Rev. Sci. Instrum., 63 (1992) 564.
    • (1988) Rev. Sci. Instrum. , vol.59 , pp. 853
    • Harp, G.1    Tonner, B.P.2
  • 28
    • 0019532418 scopus 로고
    • F. Pollack, S. Lowenthal, Rev. Sci. Instrum. 52 (1981) 207; Nucl. Instrum. Methods, 208 (1983) 373.
    • (1983) Nucl. Instrum. Methods , vol.208 , pp. 373
  • 31
    • 0345784898 scopus 로고
    • A. Septier (Ed.), Academic Press, New York, Chapter 4
    • H. Wollnik, in: A. Septier (Ed.), Focusing of Charged Particles, Academic Press, New York, 1967, Chapter 4.
    • (1967) Focusing of Charged Particles
    • Wollnik, H.1
  • 34
    • 0001545743 scopus 로고
    • Energy-Filtering Transmission Electron Microscopy
    • Springer-Verlag, Berlin
    • L. Reimer (Ed.), Energy-Filtering Transmission Electron Microscopy, Springer Seri. in Optical Sci., Vol. 71, Springer-Verlag, Berlin, 1995.
    • (1995) Springer Seri. in Optical Sci. , vol.71
    • Reimer, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.