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Surface Science

Volumn 480, Issue 3, 2001, Pages 180-187

Time-of-flight photoemission electron microscopy - A new way to chemical surface analysis

(7) Schonhense G a Oelsner, A a Schmidt, O a Fecher, G H a Mergel, V b Jagutzki, O b Schmidt Bocking H b

a JOHANNES GUTENBERG UNIVERSITY (Germany)

b GOETHE UNIVERSITY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; PHOTOELECTRON SPECTROSCOPY; SYNCHROTRON RADIATION;

TIME-RESOLVING PHOTOEMISSION MICROSCOPY;

SURFACE CHEMISTRY;

EID: 0035366882 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(01)00833-0 Document Type: Article

Times cited : (46)

References (18)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.