The novel surface science instrument: Double reflection electron emission microscope

Review of Scientific Instruments

Volumn 70, Issue 8, 1999, Pages 3346-3350

  Grzelakowski, Krzysztof ^a,b  

^a Focus GmbH   (Germany)

^b Focus Polska Spz oo   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005566320     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149917     Document Type: Article

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